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Hot Carrier Degradation in Semiconductor Devices ebook

Hot Carrier Degradation in Semiconductor Devices ebook

Hot Carrier Degradation in Semiconductor Devices. Tibor Grasser

Hot Carrier Degradation in Semiconductor Devices
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Author: Tibor Grasser
Page Count: 527 pages
Published Date: 14 Dec 2014
Publisher: Springer International Publishing AG
Publication Country: Cham, Switzerland
Language: English
ISBN: 9783319089935
Download Link: hot carrier degradation in semiconductor devices
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This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.

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